Customized parameterization of read parameters after a decoding failure for solid state storage devices

ABSTRACT

Read parameter estimation techniques are provided that obtain information from multiple read operations to customize read parameters for data recovery. One method comprises performing the following steps, in response to a decoding failure of a page of a memory or a codeword of the memory: obtaining at least three read values of the page or codeword; and processing the at least three read values to determine read parameters comprising: (i) a log likelihood ratio, and/or (ii) a center read reference voltage, wherein the determination is based on a signal count of a number of bits falling in particular regions of multiple regions of the memory and wherein the determined read parameters are used for a decoding of the page or codeword following the decoding failure and/or a subsequent read operation following a successful decoding of the page or codeword.

SUMMARY

In one embodiment, a method comprises performing the following steps, inresponse to a decoding failure of one or more of a page of a memory anda codeword of the memory: obtaining at least three read values of theone or more of the page and the codeword; and processing the at leastthree read values to determine one or more read parameters comprisingone or more of: (i) at least one log likelihood ratio, and (ii) at leastone center read reference voltage, wherein the determination is based ona signal count of a number of bits falling in particular regions of aplurality of regions of the memory and wherein the one or moredetermined read parameters are used for one more of a decoding of thepage and the codeword following the decoding failure and a subsequentread operation following a successful decoding of the one or more of thepage and the codeword.

In some embodiments, the signal counts indicate a location of a currentcenter reference voltage with respect to a substantially optimum centerreference voltage. In one or more embodiments, the step of processingthe at least three read values, or a portion thereof, is performed usinga hardware acceleration block, firmware, a state machine and/orhardware.

Other illustrative embodiments include, without limitation, apparatus,systems, controllers, methods and computer program products comprisingprocessor-readable storage media.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic block diagram of an illustrative solid statestorage system, in accordance with one or more embodiments of thepresent disclosure;

FIG. 2 illustrates a flash channel read path with read reference voltagetracking, in accordance with some embodiments of the present disclosure;

FIG. 3 is a graph of cell voltage distributions for a normal harddecision read operation in a solid state memory device, in accordancewith some embodiments of the present disclosure;

FIG. 4 illustrates an example of three read operations for an exemplaryflash memory device, according to some embodiments;

FIG. 5 illustrates an example of a log likelihood ratio (LLR) lookuptable (LUT), according to an embodiment of the disclosure;

FIG. 6 illustrates an example of a multiple LLR LUT, according to oneembodiment of the disclosure;

FIG. 7 illustrates LLR Values as a function of a Signal Counts Metric,for an exemplary flash memory device;

FIG. 8 illustrates a linear fitting to fit the LLR/signal metric pairsof FIG. 7, for the exemplary flash memory device;

FIG. 9 is a flow chart illustrating an exemplary implementation of anerror recovery process for read parameter prediction, according to oneembodiment of the disclosure;

FIG. 10 is a flow chart illustrating an exemplary implementation of anerror recovery process using customized LLR values, according to anembodiment;

FIG. 11 illustrates an exemplary LLR calculator that uses the disclosedread parameter estimation techniques for a linear model to calculate LLRvalues, according to at least one embodiment of the disclosure;

FIG. 12 illustrates various regions for an exemplary LSB page of theexemplary flash memory device;

FIG. 13 illustrates various regions for a representative CSB page of theexemplary flash memory device;

FIGS. 14 and 15 illustrate exemplary implementations for differentiatingregions for reference voltages R₂ and R₆ for the representative CSB pageof FIG. 13, according to various embodiments;

FIG. 16 illustrates the center voltage reference (V_(ref)) readparameter as a function of the Signal Counts Metric, for the exemplaryflash memory device;

FIG. 17 is a flow chart illustrating an exemplary implementation of anerror recovery process using customized center V_(ref) values, accordingto one embodiment of the disclosure;

FIGS. 18A and 18B, collectively, comprise a flow chart illustrating anexemplary implementation of an error recovery process using customizedLLR values and center V_(ref) values, according to an embodiment;

FIG. 19 illustrates an exemplary parallel implementation of an errorrecovery process using customized LLR values and center V_(ref) values,according to one embodiment of the disclosure;

FIG. 20 illustrates an exemplary firmware implementation of an errorrecovery system using customized LLR values and center V_(ref) values,according to some embodiments;

FIG. 21 illustrates an exemplary hardware implementation of an errorrecovery system using customized LLR values and center V_(ref) values,according to one or more embodiments;

FIG. 22 illustrates exemplary hardware tables for supporting LLRcalculations, according to an embodiment of the disclosure;

FIG. 23 is a flow chart illustrating an exemplary implementation of astate machine discussed in conjunction with FIG. 22, according to one ormore embodiments of the disclosure; and

FIG. 24 illustrates a processing platform that may be used to implementat least a portion of one or more embodiments of the disclosure.

DETAILED DESCRIPTION

Illustrative embodiments will be described herein with reference toexemplary solid state storage devices and associated storage media,controllers, and other processing devices. It is to be appreciated,however, that these and other embodiments are not restricted to theparticular illustrative system and device configurations shown.Accordingly, the term “solid state storage device” as used herein isintended to be broadly construed, so as to encompass, for example, anystorage device implementing the read parameter prediction techniquesdescribed herein. Numerous other types of storage systems are alsoencompassed by the term “solid state storage device” as that term isbroadly used herein.

In one or more embodiments, read parameter estimation techniques areprovided that obtain additional information from existing multiple readoperations to customize one or more read parameters for data recovery.In some embodiments, exemplary error recovery techniques are providedthat process three or more read values of a given codeword or page todetermine read parameters comprising (i) LLRs, and/or (ii) centerV_(ref), as discussed further below.

FIG. 1 is a schematic block diagram of an illustrative solid statestorage system 100. As shown in FIG. 1, the illustrative solid statememory system 100 comprises a solid state storage control system 110 anda solid state storage media 150. The exemplary solid state storagecontrol system 110 comprises a controller 120 and an encoder/decoderblock 130. In an alternative embodiment, the encoder/decoder block 130may be implemented inside the controller 120.

As shown in FIG. 1, the controller 120 comprises a page-level readreference voltage parameterization process 600, discussed below inconjunction with FIGS. 6A and 6B, to implement the read parameterprediction techniques described herein. The encoder/decoder block 130may be implemented, for example, using well-known commercially availabletechniques and/or products. The encoder within the encoder/decoder block130 may implement, for example, error correction encoding, such as alow-density parity-check (LDPC) encoding. The decoder within theencoder/decoder block 130 may be embodied, for example, as a harddecision decoder, such as a hard decision low-density parity-check(HLDPC) decoder.

The solid state storage media 150 comprises a memory array, such as asingle-level or multi-level cell flash memory, a NAND flash memory, aphase-change memory (PCM), a magneto-resistive random access memory(MRAM), a nano RAM (NRAM), a NOR (Not OR) flash memory, a dynamic RAM(DRAM) or another non-volatile memory (NVM). While the disclosure isillustrated primarily in the context of a solid state storage device(SSD), the disclosed read parameter prediction techniques can be appliedin solid state hybrid drives (SSHD) and other storage devices, as wouldbe apparent to a person of ordinary skill in the art based on thepresent disclosure.

FIG. 2 illustrates a flash channel read path 200 with channeltracking-based read retry voltage adjustment in accordance with someembodiments of the present disclosure. The read path 200 includes aflash device 202 having an array of memory cells, or another type ofnon-volatile memory. Based upon the disclosure provided herein, one ofordinary skill in the art will recognize a variety of storagetechnologies that can benefit from the read parameter predictiontechniques disclosed herein.

Read reference voltages 226 are applied to the flash device 202 by aread control device 224 in a series of N reads. Each memory cell is readN times, and the N reads result in read data 204 containing N bits permemory cell as a quantized version of the stored voltage on the memorycell. The read data 204 is buffered in a read buffer 206, and bufferedread data 210 from read buffer 206 is provided to a log likelihood ratio(LLR) generation circuit 212 (or likelihood generator, which can also beadapted to use plain likelihood values). The N bits for a memory cellare mapped to log likelihood ratios 214 for the memory cell in loglikelihood ratio generation circuit 212. In some embodiments, the loglikelihood ratio generation circuit 212 contains a lookup table thatmaps the read patterns in buffered read data 210 to log likelihoodratios 214.

A tracking module 230 receives the buffered read data 210 from the readbuffer 206, or from any other suitable source. Generally, channeltracking techniques adapt to the changes in read reference voltages tomaintain a desired performance level. Adaptive tracking algorithmstypically track variations in the solid state storage channel andconsequently, help to maintain a set of updated channel parameters. Theupdated channel parameters are used, for example, to adjust readreference voltages. United States Published Patent Application No.2013/0343131, filed Jun. 26, 2012, entitled “Fast Tracking for FlashChannels,” and/or United States Published Patent Application No.2015/0287453, entitled “Optimization of Read Thresholds for Non-VolatileMemory,” (now U.S. Pat. No. 9,595,320) incorporated by reference hereinin their entirety, disclose techniques for adapting read referencevoltages.

The tracking module 230 identifies the intersection point betweenneighboring voltage distributions for a memory cell, in a known manner,and provides read reference voltage level V_(REF0) 232, including theread reference voltage V_(REF0) corresponding to the intersection. Whenthe read reference voltage V_(REF0) corresponding to the intersection isused for the soft read operation, it will result in a reduction in thebit error rate. The read reference voltage V_(REF0) is used in someembodiments as the first read reference voltage of a read retryoperation, and additional read reference voltages around V_(REF0) toobtain substantially all possible log likelihood ratio values. Thetracking module 230 thus generates the read reference voltage levelV_(REF0) 232 to be used in read retry operations. In other embodiments,V_(REF0) may not correspond to the intersection of the distributionsdepending on the tracking algorithm design, tracking inaccuracy, or theactual channel distributions deviating from Gaussian behavior in eitherthe peak or the tail. In other situations, V_(REF0) may coincide withthe intersection of the distributions but may not be applied first andthat would be accounted for in the calculations in 212 and 224.

The tracking module 230 also tracks the voltage distributions 234. Insome embodiments, the tracking module 230 calculates the voltagedistribution means and variances for each voltage distribution 234corresponding to each possible state in each memory cell. The voltagedistributions 234 can be calculated in any suitable manner based on theread data. As an example, the tracking module 230 can operate asdisclosed in U.S. Published Patent Application No. 2013/0343131, filedJun. 26, 2012, entitled “Fast Tracking for Flash Channels,” incorporatedby reference herein in its entirety. In some embodiments, the trackingmodule 230 tracks intersections without estimating means or variances.

For a two-state memory cell, or single-level memory cell, the trackingmodule 230 estimates the means and variances of the voltagedistributions of states “1” and “0”, as well as the read referencevoltage V_(REF0) that most reduces the bit error rate and which likelylies at the intersection of those distributions, in a known manner.

The tracking module 230 provides the voltage distributions 234 to thelog likelihood ratio generation circuit 212 for use in updating the loglikelihood ratio lookup table. The log likelihood ratio generationcircuit 212 is used to calculate likelihood values 214 for decoding byan LDPC (low-density parity-check) decoder 216 that generates decodeddata 220. The log likelihood ratio generation circuit 212 alsodetermines where to place the other N−1 read reference voltages aroundV_(REF0) 232 based on the voltage distributions 234 and on the readreference voltage V_(REF0) 232 to obtain substantially all possible loglikelihood ratio values when the read patterns in buffered read data 210are mapped to log likelihood ratios. The log likelihood ratio generationcircuit 212 determines where to place the other N−1 read referencevoltages around V_(REF0) 232, updates the lookup table, and provides theN−1 read reference voltage levels 222 to a read controller 224. It isimportant to note that the division of functionality is not limited tothe example embodiments disclosed herein. For example, in otherembodiments, the tracking module 230 calculates and provides readreference voltages around V_(REF0) 232 and provides those voltages tothe log likelihood ratio generation circuit 212, rather than the loglikelihood ratio generation circuit 212 determining where to place theother N−1 read reference voltages around V_(REF0) 232, and thesedivisions of functionality are to be seen as equivalent.

The read reference voltages are stored in log likelihood ratiogeneration circuit 212 in some embodiments, as calculated based on thelog likelihood ratio lookup table in log likelihood ratio generationcircuit 212 and on the voltage distribution means and variances 234 fromtracking module 230.

The read controller 224 controls read retry operations in the flashdevice 202, providing each of the N read reference voltages (includingV_(REF0) 232) to be used when reading the memory cells in the flashdevice 202. The read controller 224 initiates N reads of a page, withthe first read using read reference voltage V_(REF0) in someembodiments, and with the subsequent N−1 reads at read referencevoltages around V_(REF0) as determined by log likelihood ratiogeneration circuit 212.

FIG. 3 is a graph 300 of cell voltage distributions 311 through 318 fora normal hard decision read operation in a TLC flash memory device, inaccordance with some embodiments of the present disclosure. Theexemplary TLC flash memory device is a BiCS3 NAND flash memory fromToshiba Memory America, Inc. The resulting voltages read from the memorycell thus appear something like the distributions 311-318 shown in thegraph 300 of FIG. 3, rather than eight distinct discrete voltage levelscorresponding to the eight states 111, 110, 100, 000, 010, 011, 001, 101at the corresponding target state voltage levels. Each distribution311-318 will have a mean roughly equal to the target voltage for therespective state, and the variance will depend upon the noise. Becausethe voltages on the memory cell are not accurate, the voltages read backcan vary according to the distributions 311-318. In some embodiments,during the initial read of the memory cell, reference voltages R₁ (i=1,2, . . . , 7) (e.g., R₁ through R₇) are used during a read to determinethe state of the memory cell, returning hard decisions about the stateof the memory cell.

For example, in general, if the read voltage is below reference voltageR₁, a decision indicates that the memory cell is determined to be instate 111. If the read voltage is above reference voltage R₁ and belowreference voltage R₂, a decision indicates that the memory cell isdetermined to be in state 110, and so on.

The first, second, and third bits in a given state are often referred toas the most-significant bits, center-significant bits, andleast-significant bits (MSB, CSB, LSB), respectively. In someembodiments, the read operation is divided into a process of readingleast significant bit (LSB) pages, center significant bit (CSB) pagesand most significant bit (MSB) pages. States 111, 011, 001 and 101, forexample, correspond to a least significant bit value of 1, and states110, 100, 000 and 101 correspond to a least significant bit value of 0.When reading the least significant bit, for example, the referencevoltages R₁ and R₅ are applied to the memory cell to obtain the leastsignificant bit.

While FIG. 3 illustrates the cell voltage distributions for a TLC flashmemory, the disclosed read parameter prediction techniques can beapplied to SLC, MLC, QLC, etc. and other flash memory systems, as wouldbe apparent to a person of ordinary skill in the art.

For each R_(i) shown in FIG. 3, a pair (V_(0i),P_(i)) can be derived foreach page number, where V_(oi) is the substantially optimal referencevoltage that substantially minimizes the bit error rate, and P_(i) isthe corresponding page number.

Read Parameter Prediction Techniques

In one or more embodiments, techniques are provided for read parameterprediction using three or more read operations of a solid state storagedevice, such as a flash memory. In flash memory systems, a single-readproduces hard information (such as bit estimation of “0” or “1”). Ifhard information is not sufficient to recover the data, additional readoperations are usually issued to generate soft information for adecoding process. The way the soft information is generated frommultiple read operations has a direct impact on the error recoveryperformance. The present disclosure discloses efficient methods whereread parameters, such as an LLR and center voltage reference (V_(ref))are predicted from three initial read operations. The predicted LLRprovides more accurate soft information for an error correction decoder(such as an LDPC decoder); while the estimated center V_(ref) isexpected to reduce the raw bit error count. In either case, the errorrecovery performance is improved.

Multiple Read operations in Flash Memory

For an initial error recovery process in a flash memory, a single-readoperation is typically issued, and the hard information is mapped intolog LLR values that are passed to error correction decoder to recoverthe data. If the decoder fails to decode, then additional readoperations are issued (in some cases, more single-read operations withdifferent reference voltage values are issued before multiple readoperations.). FIG. 4 illustrates an example 400 of three read operationsfor an SLC device, according to some embodiments, where a center readoperation (denoted by T_(C)) and two shoulder read operations (denotedby T_(l) and T_(r)) are issued. The three read operations yield fourregions, denoted in FIG. 4 by regions A, B, C and D. Region A isinterpreted as a binary 1 and region D is interpreted as a binary 0.Each region A, B, C and D corresponds to a reading pattern from thethree read operations and therefore each region is differentiable. Forexample, region A is labelled by ‘111’, region B is labelled by ‘011’,region C is labelled by ‘001’ and region D is labelled by ‘000’.

Bits falling in each region are usually mapped to an LLR value using apredetermined lookup table. FIG. 5 illustrates an example of an LLRlookup table (LUT) 500, according to an embodiment of the disclosure.The assigned LLR values in FIG. 5 are then sent to a decoder for softdecoding. If the decoding still fails, other error recovery steps/plansare executed. The information derived from multiple read operationsresults in labelling each region using FIG. 4, guides the subsequent LLRmapping.

According to one or more embodiments of the present disclosure,additional information is obtained from the existing multiple readoperations, to customize one or more read parameters for data recovery,as discussed hereinafter. In some embodiments, exemplary error recoverytechniques are provided that process three or more read values of agiven codeword or page to determine read parameters comprising (i) LLRs,and/or (ii) center V_(ref), as discussed further below.

Available Data Statistics

A signal count of a specified region is defined as the number of bitsfalling in that region. In the example of FIG. 4, the signal count, S,of each region (A, B, C and D) can be represented by S_(A), S_(B), S_(C)and S_(D), respectively. If reference data is available, the signalcounts of the four regions are also available for the given readoperations. The values of signal counts provide insights on the centerV_(ref) location with respect to a substantially optimum value, as wellas the reliability of the bits falling in those regions. For example, ifS_(B)≈S_(C), the center V_(ref) T_(C) is likely to be close to asubstantially optimum value, and the bits falling in regions B and Chave a similar reliability level; if S_(B)<<S_(C), the center V_(ref)T_(C) is likely to locate to the right of the substantially optimumvalue and the bits falling in region C might have a higher reliabilitylevel than those bits falling in region B. The following sectionsexplain how LLR values and center V_(ref) are estimated using these bincounts, in some embodiments of the disclosure.

LLR Estimation

In a flash memory, neighboring bits are mapped to the same LLR value.For example, the LLR of region A is mathematically defined in equation(1),

$\begin{matrix}{{LL{R(A)}} = {\log \frac{\begin{matrix}{{number}\mspace{20mu} {of}\mspace{14mu} {bits}\mspace{14mu} {read}\mspace{14mu} {in}\mspace{14mu} A\mspace{14mu} {that}} \\{{were}\mspace{14mu} {programmed}\mspace{14mu} {as}\mspace{14mu} {{}_{}^{}{}_{}^{}}}\end{matrix}}{\begin{matrix}{{number}\mspace{20mu} {of}\mspace{14mu} {bits}\mspace{14mu} {read}\mspace{14mu} {in}\mspace{14mu} A\mspace{14mu} {that}} \\{{were}\mspace{14mu} {programmed}\mspace{14mu} {as}\mspace{14mu} {{}_{}^{}{}_{}^{}}}\end{matrix}}}} & (1)\end{matrix}$

Likewise, LLR(B), LLR(C) and LLR(D) can be defined in a same manner.

Conventionally, one or more predetermined LLR-LUTs are used for LLRmapping. FIG. 6 illustrates an example of a multiple LLR LUT 600,according to one embodiment of the disclosure. Once three readoperations are issued, the decoder tries to decode the data with LLRLUT, 2, . . . , N of FIG. 6, e.g., sequentially, until one of the LUTssuccessfully recovers the data.

Usually region A and D in FIG. 4 are regarded as high reliable regions,where bits are considered to be 0 and 1, respectively, with a highprobability. Therefore, regions A and D are usually assigned LLR valueswith large absolute values (for example, −7 and 7 as shown in FIG. 6).The sensitive regions are B and C, where errors typically occur. Thevalues of LLR(B) and LLR(C) in FIG. 6 are therefore important for errorcorrection decoder. A predetermined LUT, such as the LUT of FIG. 6,lacks the flexibility to accommodate various noise patterns in the data.The following discussion shows how to estimate LLR(B) and LLR(C)dynamically using signal counts of different regions. LLR(A) and LLR(D)can be estimated in a similar manner, as would be apparent to a personof ordinary skill in the art, based on the discussion herein.

The correlation between LLR values and signal counts metric is firstderived. For each codeword, the values of LLR(B) and LLR(C) can becalculated using equation (1), given the availability of genie data.With 3 read operations, the signal counts S_(B) and S_(C) are alsoavailable. It can be shown that both LLR(B) and LLR(C) have a positivecorrelation with the signal counts metric (S_(B)−S_(C)).

FIG. 7 illustrates LLR Values as a function of the Signal Counts Metric(S_(B)−S_(C)) 700, for an exemplary Toshiba BiCS3 NAND flash memorydevice. In FIG. 7, each point represents either a pair of either(LLR(B), S_(B)−S_(C)) (lower right portion of plot) or (LLR(C),S_(B)−S_(C)) (upper left portion) derived from a single codeword, usingequation (1).

If such information (pairs) from enough codewords are collected, thecorrelation between LLR values and signal counts metric S_(B)−S_(C), asshown in FIG. 7, can be represented by a linear fitted curve.

FIG. 8 illustrates a linear fitting 800 using linear curves 810-C and810-B, to fit the (LLR(B), S_(B)−S_(C)) and (LLR(C), S_(B)−S_(C)) pairsof FIG. 7, for the exemplary Toshiba BiCS3 NAND flash memory device.

The linear curves 810-B and 810-C are fitted for LLR(B) and LLR(C),respectively, and can be represented by equation (2) and (3),

LLR(B,S _(B) −S _(C))=a _(B)*(S _(B) −S _(C))+b _(B),  (2)

LLR(C,S _(B) −S _(C))=a _(C)*(S _(B) −S _(C))+b _(C).  (3)

The disclosed techniques for representing the correlation between LLRvalues and signal counts metric using linear curves 810-B and 810-C canbe extended to employ non-linear curves as well, as described, forexample, in U.S. patent application Ser. No. 16/144,65, filed Sep. 27,2018, entitled “Page-Level Reference Voltage Parameterization For SolidState Storage Devices,” incorporated by reference herein in itsentirety.

FIG. 9 is a flow chart illustrating an exemplary implementation of anerror recovery process 900 for read parameter prediction, according toone embodiment of the disclosure. As shown in FIG. 9, the exemplary 900initially reads a codeword/page during step 910. A test is performedduring step 920 to determine if the codeword/page is recovered by thedecoder.

If it is determined during step 920 that the codeword/page is recoveredby the decoder, then program control exits during step 920. If, however,it is determined during step 920 that the codeword/page is not recoveredby the decoder, then three or more read values are obtained of thecodeword/page during step 925.

During step 930, the exemplary error recovery process 900 processes thethree or more read values of codeword/page to determine read parameterscomprising (i) LLRs, and/or (ii) center V_(ref), as discussed furtherbelow.

FIG. 10 is a flow chart illustrating an exemplary implementation of anerror recovery process 1000 using customized LLR values, according toone embodiment of the disclosure. Generally, after additional readoperations are issued and soft decoding with default (predetermined) LLRLUT fails, the metric S_(B)−S_(C) is calculated and the customized LLRvalues are calculated using equations (2) and (3). The newly calculatedLLR values are then used to map soft information (instead of using thepredetermined LLR-LUTs shown in FIG. 5). Since the metric S_(B)−S_(C) isdynamically calculated/measured for each codeword (or page) and the LLRvalues are calculated in this manner as well. It can thus be shown thatthe exemplary error recovery process 1000 of FIG. 10 will yield a moreaccurate reliability level for the decoder. Note that, in someembodiments, the LLR estimation is accomplished with the existingmultiple read operations without additional read operations.

As shown in FIG. 10, the exemplary error recovery process 1000 initiallyissues a single read operation during step 1005. The hard information isthen mapped to LLR values during step 1010 with a predetermined LLR-LUTfor decoding (e.g., that maps bits to two values in some embodiments(e.g., −7 and 7)). Hard decoding is then performed during step 1015.

A test is performed during step 1020 to determine if the decodingsucceeds. If it is determined during step 1020 that decoding succeeds,then program control exits during step 1070. If, however, it isdetermined during step 1020 that decoding does not succeed, then twoadditional read operations are issued during step 1025. A test isperformed during step 1035 to determine if the decoding succeeds. If itis determined during step 1035 that decoding succeeds, then programcontrol exits during step 1070. If, however, it is determined duringstep 1035 that that decoding does not succeed, then S_(g) and S_(C) arecalculated during step 1040 using equation (1) and the metricS_(B)−S_(C) is calculated during step 1045. LLR(B) and LLR(C) values arecomputed during step 1050 using equations (2) and (3).

Soft Information is mapped to LLR Values with Computed LLRs during step1055. A test is performed during step 1060 to determine if the decodingsucceeds. If it is determined during step 1060 that decoding succeeds,then program control exits during step 1070. If, however, it isdetermined during step 1060 that decoding does not succeed, then otherError Recovery Actions are optionally performed during step 1065.

One or more aspects of the present disclosure recognize that theparameters a_(B), b_(B), a_(C) and b_(C) used by step 1050 of the errorrecovery process 1000 can be calculated using offline data and stored inmemory (e.g. a DRAM).

FIG. 11 illustrates an exemplary LLR calculator 800 that uses thedisclosed read parameter estimation techniques for a linear model tocalculate LLR(B), according to at least one embodiment of thedisclosure. As shown in FIG. 11, to compute an LLR value for anexemplary page, the exemplary LLR calculator 1100 processes the metricS_(B)−S_(C) 1110, the page type 1120 (e.g., LSB/CSB/MSB/SLC); a regionidentifier 1130 (e.g., a die identifier); and/or one or more NANDconditions 840 (e.g., retention, P/E cycle, program/read temperature,etc.), to read the coefficients a_(B) and b_(B) from memory 1150 (e.g.,a DRAM memory). Representative LLR(B) is computed by the exemplary LLRcalculator 800 using equation (2). An implementation for computingLLR(C) would be similar to the implementation for LLR(B), as would beapparent to a person of ordinary skill in the art.

For a multi-level cell NAND (such as MLC, TLC or QLC), where for somepage types multiple reference voltages (V_(ref) values) are involved,the parameters can be tuned for each individual V_(ref). FIG. 12illustrates various regions for an exemplary LSB page of the exemplaryToshiba BiCS3 NAND flash memory device. For the LSB page of FIG. 12, R₁and R₅ are the two relevant V_(ref) values. The regions B₁, C₁, B₅ andC₅ are differentiable from the three-read patterns. Therefore, thelinear fitting can be conducted independently to derive (a_(1B), b_(1B),a_(1C), b_(1C)) for R₁ and (a_(5B), b_(5B), a_(5C), b_(5C)) for R₅ suchthat,

LLR(B _(i) ,S _(iB) −S _(iC))=a _(iB)*(S _(iB) −S _(iC))+b _(iB),  (4)

LLR(C _(i) ,S _(iB) −S _(iC))=a _(iC)*(S _(iB) −S _(iC))+b _(iC),  (5)

where S_(iB) and S_(iC) are the signal counts of region B_(i) and C_(i)and i∈{1,5}.

In some cases, the regions from different V_(ref) values are notdifferentiable. FIG. 13 illustrates various regions for a representativeCSB page of the exemplary Toshiba BiCS3 NAND flash memory device, whereR₂, R₄ and R₆ are the three relevant V_(ref) values. Without readingother pages, the three-read patterns can only measure B₄, C₄, B₂+B₆ andC₂+C₆. In other words, the corresponding regions of R₂ and R₆ are notdifferentiable.

In some embodiments, two methods can be applied when the correspondingregions for reference voltages R₂ and R₆ are not differentiable:

1) Apply a linear fitting for reference voltages R₂ and R₆ by using thesame metric (S_(2B)+S_(6B))−(S_(2C)+S_(6C)). FIG. 14 illustrates anexemplary implementation 1400 for differentiating regions for referencevoltages R₂ and R₆ for the representative CSB page of FIG. 13 withoutsupporting pages (e.g., with the existing three read operations) byusing the same LLR label for both regions of reference voltages R₂ andR₆ of FIG. 13, according to an embodiment. Note that the regions B_(j)and C_(j) can be labelled by a three-read pattern. For example, with theconvention of reading pattern [T_(l)T_(C)T_(r)], B₂ and B₆ share thesame label of ‘011’; C₂ and C₆ share the same label of ‘001’; B₄ islabelled as ‘100’ and C₄ as ‘110’. Without supporting pages, the bincounts 1410 in these non-differentiable regions are established asfollows: S₀₁₁=S_(2B)+S_(6B) and S₀₀₁=S_(2C)+S_(6C). Then, for referencevoltages R₂ and R₆, the fitting becomes, at stages 1425-1 and 1425-2,

LLR(B _(j) ,S ₀₁₁ −S ₀₀₁)=a ₀₁₁*(S ₀₀₁ −S ₀₀₁)+b ₀₁₁,  (4)

LLR(C _(j) ,S ₀₁₁ −S ₀₀₁)=a ₀₁₁*(S ₀₀₁ −S ₀₀₁)+b ₀₁₁,  (5)

where j∈{2,6}. Note that the same LLR values are applied to theambiguous regions, e.g., LLR(B₂,S₀₁₁−S₀₀₁)=LLR(B₆,S₀₀₁−S₀₀₁)=LLR₀₁₁ andLLR(C₂,S₀₁₁−S₀₀₁)=LLR(C₆,S₀₁₁−S₀₀₁)=LLR₀₀₁. The coefficients as and bsare stored in registers 1420. The resulting LLR values are stored in anLUT 1430.

2) Read support pages to differentiate regions of R₂ and R₆. However,this method requires additional read operations. FIG. 15 illustrates anexemplary implementation 1500 for differentiating regions of referencevoltages R₂ and R₆ for the representative CSB page of FIG. 13 withsupporting pages (e.g., with additional read operations), according tosome embodiments. In FIG. 15, additional support pages are used help todifferentiate regions coming from different thresholds. For example,S_(2,011) denotes the signal count 1510 of region B₂, while S_(6,011)denotes the signal count 1510 of region B₆. The corresponding LLR values(computed at stages 1525-1 and 1525-12 and are stored in the LUT 1530),such as LLR_(2,011) and LLR_(6,011), are also differentiable. In FIG.15, s represents different thresholds. With the supporting information,each threshold can calculate its LLR values individually. Thecoefficients as and bs are stored in registers 1520.

Note that, other type of fittings (e.g., a non-linear fitting) can alsobe applied for LLR estimation, in the manner described above. The metricis also not necessarily constrained to the difference of the signalcounts between two regions specified above. Depending on the NANDcharacteristics, various fitting methods with various metrics can beapplied.

The fitting parameters are calculated offline, but can also be updatedon-the-fly whenever new samples are available, as would be apparent to aperson of ordinary skill in the art.

Center V_(ref) Estimation

As noted above, the disclosed error recovery techniques can also processthe three or more read values of a given codeword or page to determine acenter V_(ref) read parameter, as discussed hereinafter. The signalcounts of different regions provide insights into the relative locationof the current center V_(ref) with respect to a substantially optimumvalue. Therefore, the signal count metric can also be used to estimate amore effective center V_(ref) read parameter, which is expected toreduce the errors in the raw data.

FIG. 16 illustrates the center V_(ref) read parameter as a function ofthe Signal Counts Metric (S_(B)−S_(C)) 1600, for the exemplary ToshibaBiCS3 NAND flash memory device. In FIG. 16, each point represents a pairof (V_(ref), S_(B)−S_(C)) values. If such information (pairs) fromenough codewords are collected, for example, the correlation betweencenter V_(ref) values (with respect to a substantially optimal V_(ref))and the signal counts metric S_(B)−S_(C), as shown in FIG. 16, can berepresented by a linear fitted curve 1620, which can be expressed byequation (6), as follows:

V=∝*(S _(B) −S _(C))+β.  (6)

FIG. 17 is a flow chart illustrating an exemplary implementation of anerror recovery process 1700 using customized center V_(ref) values,according to one embodiment of the disclosure.

As shown in FIG. 17, the exemplary error recovery process 1700 initiallyissues three read operations during step 1710. Thereafter, the signalcounts, S_(B) and S_(C), are calculated during step 1720, and the signalcounts metric, S_(B)−S_(C), is calculated during step 1730.

Equation (6) is employed during step 1740 to compute the center V_(ref)value, by obtaining the corresponding parameters ∝ and β from memory forthe center V_(ref) calculation. During step 1750, T_(C) (current centerV_(ref); see, e.g., FIG. 4) and V are used as the new center V_(ref)value for a single read operation or multiple read operations. Finally,additional error recovery (e.g., error correction decoding) is performedduring step 1760.

It is noted that the linear fitting parameters can be tuned for eachindividual V_(ref), and various NAND conditions, as would be apparent toa person of ordinary skill in the art, in a manner Similar to the LLRestimation techniques described above.

Combination of LLR Estimation and Center V_(ref) Estimation

FIGS. 18A and 18B, collectively, are a flow chart illustrating anexemplary implementation of an error recovery process 1800 usingcustomized LLR values and center V_(ref) values, according to oneembodiment of the disclosure. As noted above, with three existing readoperations, LLR values and center V_(ref) offset values can becalculated independently. The disclosed error recovery techniques canincorporate one or both of the customized LLR values and center V_(ref)values. When both values and center V_(ref) offset values are included,the execution order can be performed in either manner. In the exemplaryembodiment of FIG. 18, decoding is performed first using customized LLRvalues, followed by the new center V_(ref) offset values.

As shown in FIG. 18A, the exemplary error recovery process 1800initially issues a single read operation during step 1805. The hardinformation is then mapped to LLR values during step 1810 (e.g., with apredetermined LLR-LUT (e.g., of FIG. 5 or FIG. 6)). Hard decoding isthen performed during step 1815.

A test is performed during step 1820 to determine if the decodingsucceeds. If it is determined during step 1820 that decoding succeeds,then program control proceeds to FIG. 18B and exits during step 1898.If, however, it is determined during step 1820 that decoding does notsucceed, then two additional read operations are issued during step1825. A test is performed during step 1835 to determine if the decodingsucceeds. If it is determined during step 1835 that decoding succeeds,then program control proceeds to FIG. 18B and exits during step 1898.If, however, it is determined during step 1835 that that decoding doesnot succeed, then S_(B) and S_(C) are calculated during step 1840 (e.g.,using equation (1)). Program control then proceeds to FIG. 18B.

As shown in FIG. 18B, the exemplary error recovery process 1800 thencalculates the metric S_(B)−S_(C) during step 1855. LLR(B) and LLR(C)values are computed during step 1860 (e.g., using equations (2) and(3)).

Soft Information is mapped to LLR Values with Computed LLRs during step1865. A test is performed during step 1870 to determine if the decodingsucceeds. If it is determined during step 1870 that decoding succeeds,then program control exits during step 1898. If, however, it isdetermined during step 1870 that decoding does not succeed, thenEquation (6) is employed during step 1875 to compute the new centerV_(ref) value (e.g., by obtaining the corresponding parameters ∝ and βfrom memory for the center V_(ref) calculation). During step 1880, T_(C)(current center V_(ref); see, e.g., FIG. 4) and V are used as the newcenter V_(ref) value for a single read operation or for multiple readoperations.

During step 1885, hard and/or soft decoding is performed withpredetermined or customized LLR values. A test is performed during step1890 to determine if the decoding succeeds. If it is determined duringstep 1890 that decoding succeeds, then program control exits during step1898. If, however, it is determined during step 1890 that decoding doesnot succeed, then additional error recovery (e.g., error correctiondecoding) is performed during step 1894.

FIG. 19 illustrates an exemplary parallel implementation of an errorrecovery process 1900 using customized LLR values and center V_(ref)values, according to an embodiment. Generally, the processing timelinefor FIG. 19 proceeds from left to right, and downward. The exemplaryerror recovery process 1900 comprises a set of read operations 1910, ahardware acceleration block 1915 and a set of decode operations 1920.Thus, in the exemplary embodiment of FIG. 19, the parallelism isachieved by using a dedicated hardware block 1915 to perform parameterestimation.

As shown in FIG. 19, the exemplary parallel error recovery process 1900initially performs a single read operation during step 1925 and thenapplies hard decoding during step 1930. Two additional read operationsare performed during step 1935 and then a customized page LLR iscomputed by hardware acceleration block 1940, in accordance with thedisclosed techniques. Conventional soft decoding is applied during step1945 using default LLRs, while soft decoding is also applied in parallelduring step 1950 using the customized LLRs computed by hardwareacceleration block 1940, in accordance with the disclosed techniques.

As shown in FIG. 19, additional support pages are read during step 1955and hard decoding is applied during step 1960, using the techniquesdiscussed above in conjunction with FIGS. 12 and 13. Customized wordlineoffsets are computed during step 1970 to compute the new center V_(ref)value.

The new center V_(ref) value is used for a single read operation duringstep 1975 and then hard decoding is applied during step 1980. Twoadditional read operations are performed during step 1985 and then acustomized page LLR is computed by hardware acceleration block 1990, inaccordance with the disclosed techniques. Conventional soft decoding isapplied during step 1995 using default LLRs, while soft decoding is alsoapplied in parallel during step 1998 using the customized LLRs computedby hardware acceleration block 1990, in accordance with the disclosedtechniques.

Implementation Options

FIG. 20 illustrates an exemplary firmware implementation of an errorrecovery system 2000 using customized LLR values and center V_(ref)values, according to some embodiments. As shown in FIG. 20, data is readfrom a flash memory 2010 and stored in a common read buffer 2015. Adedicated bin generation/accumulation block 2020 then measures thestatistics for each bin (e.g., S_(B) and S_(C), for example). Toaccommodate a QLC format, for example, there are up to 64 bins 2030. Inthe embodiment of FIG. 20 with firmware intervention, the prediction ofLLR LUTs and the new center V_(ref) offset are performed by firmware2040.

The customized LLR values are stored in a digital LUT (DLUT) 2050 andused for LDPC decoding 2060 of the read values from buffer 2010. The newcenter V_(ref) offset 2070 is used for a new read operation applied tothe flash memory 2010.

FIG. 21 illustrates an exemplary hardware implementation of an errorrecovery system 2100 using customized LLR values and center V_(ref)values, according to one or more embodiments. As shown in FIG. 21, datais read from a flash memory 2110 and stored in a common read buffer2120. A dedicated bin generation/accumulation block 2150 then measuresthe statistics for each bin (e.g., S_(B) and S_(C), for example). In theembodiment of FIG. 21 with a hardware implementation, the customized LLRvalues are stored in a DLUT 2160 and used for LDPC decoding 2170 of theread values from buffer 2120. The new center V_(ref) offset 2180 is usedfor a new read operation applied to the flash memory 2110.

In some embodiments, an important aspect of a hardware implementation isthe generality and flexibility, as mapping between pages and symbolsvaries between flash vendors and flash generations. The disclosedarchitecture in FIG. 21 uses programmable tables to retain sufficientflexibility.

Assume that the hardware contains a mechanism to bin the result of threeread operations with different threshold voltages. The binary values arethen concatenated into three-bit words resulting in eight differentvalues (0-7 decimal) which are used as address into bins. The bins areincremented every time a particular value is obtained resulting in ahistogram of the different symbols. If supporting information isavailable, then separate groups of eight bins correspond to eachcombination of the supporting information.

Once sufficient statistics have been accumulated, the LLR values (andthreshold voltage offsets) can be calculated by a state machine thatrelies on several tables loaded by firmware.

FIG. 22 illustrates exemplary hardware tables 2200 for supporting LLRcalculations, according to one embodiment of the disclosure. As shown inFIG. 22, the exemplary hardware tables 2200 comprise bins 2210, a firstbin pointer 2220, pointers 2230, a second bin pointer 2240, types 2250and coefficients 2260.

The exemplary hardware tables 2200 provide an implementation of thecalculation discussed above in conjunction with FIG. 15. Thus, theexemplary hardware tables 2200 differentiate regions of referencevoltages R₂ and R₆ for the representative CSB page of FIG. 13 withsupporting pages ‘1’ and ‘0’ (e.g., with additional read operations ofpages ‘1’ and ‘0’). Bins 2210 correspond to the bin counts 1510, and thecoefficients 2260 correspond to the registers 1520.

Generally, the bins table 2210, pointers table 2230 and types table 2250are all addressed using the same bin pointer 2220. The pointers table2230 is used to implement linked lists that enable sums and/ordifferences of arbitrary bin values. The types table 2250 allows thestate machine to generate both constant LLR values (such as +/−7 forhigh confidence regions) and computed LLR values for the remainingregions. If the types table 2250 contains a constant field, then theentries are ‘c’, sign and magnitude of the constant. The pointer field2230 contains a ‘p’, a sign bit indicating whether the accumulated binvalue should be added or subtracted and a coefficient pointer (cp)providing an address for the coefficients table 2260.

For example, the LLR₁₁₀ value shown in FIG. 15 can be calculated by thefollowing steps. Assume that the bin pointer 2220 has reached address 6.The type is then ‘p’ with a sign of +1, so a variable is initialized to+S₁₁₀. The bin pointer 2220 is then replaced with the value of thepointer table 2230 at address 6, which is 4. The type entry from table2250 at address 4 is again ‘p’ with a sign of −1. The variable is thenupdated to +S₁₁₀−S₁₀₀. The bin pointer 2220 is again replaced by thevalue at address 4, which is 6. Since this is the original value, theprocess terminates with a calculation of the LLR value using the lastentry of the types table 2250 at address 6 as a coefficient pointer tothe coefficient table 2260. At address 6, this pointer is 3 which thenenables the state machine to calculate the LLR₁₁₀ value asa₁₁₀*(+S₁₁₀−S₁₀₀)+b₁₁₀.

FIG. 23 is a flow chart illustrating an exemplary implementation of thestate machine discussed in conjunction with FIG. 22, according to one ormore embodiments of the disclosure. As shown in FIG. 23, the bin pointer(bp) 2220 is initialized to zero during step 2310. A test is performedduring step 2315 to determine if the entry in the types table 2250pointed to by the bin pointer 2220 is of type c or type p. If it isdetermined during step 2315 that the corresponding entry is type c, thena constant is written into the LUT during step 2320, and the bin pointer2220 is incremented during step 2325. Program control returns to step2315.

If, however, it is determined during step 2315 that the correspondingentry is type p, then a variable init_bp is initialized to the currentvalue of the bin pointer 2220 during step 2330. A variable value is thenset during step 2335 to the sign indicated in the entry in the typestable 2250 pointed to by the bin pointer 2220, multiplied by the bincount value in the entry in the bin table 2210 pointed to by the binpointer 2220. The bin pointer 2220 is then replaced during step 2340with the value of the pointer table 2230 at the address pointed to bythe bin pointer 2220.

A test is performed during step 2345 to determine if the bin pointer2220 equals the variable init_bp. If it is determined during step 2345that the bin pointer 2220 does not equal the variable init_bp, thenprogram control returns to step 2335.

If, however, it is determined during step 2345 that the bin pointer 2220does equal the variable init_bp, then the LLR value associated with thebin pointer 2220 is computed during step 2350, the new LLR value iswritten into the LUT during step 2355 and the bin pointer 2220 isincremented during step 2360. Program control then returns to step 2315.

It is noted that using a linked list results in a general solution wherethe number of terms in the expression is arbitrary (e.g., it is notlimited to just two bin values).

CONCLUSION

In one or more embodiments of the disclosure, techniques are providedfor read parameter prediction. It should be understood that the readparameter prediction techniques illustrated in FIGS. 1 through 23 arepresented by way of illustrative example only, and should not beconstrued as limiting in any way. Numerous alternative configurations ofsystem and device elements and associated processing operations can beused in other embodiments.

Illustrative embodiments disclosed herein can provide a number ofsignificant advantages relative to conventional arrangements. Forexample, one or more embodiments provide a significantly improvedcodeword failure rate without increasing latency or complexity.

It is to be appreciated that the particular advantages described aboveand elsewhere herein are associated with particular illustrativeembodiments and need not be present in other embodiments. Also, theparticular types of read parameter prediction features and functionalityas illustrated in the drawings and described above are exemplary only,and numerous other arrangements may be used in other embodiments.

As mentioned previously, at least portions of the disclosed readparameter prediction system may be implemented using one or moreprocessing platforms. A given such processing platform comprises atleast one processing device comprising a processor coupled to a memory.The processor and memory in some embodiments comprise respectiveprocessor and memory elements of a virtual machine or container providedusing one or more underlying physical machines. The term “processingdevice” as used herein is intended to be broadly construed so as toencompass a wide variety of different arrangements of physicalprocessors, memories and other device components as well as virtualinstances of such components. For example, a “processing device” in someembodiments can comprise or be executed across one or more virtualprocessors. Processing devices can therefore be physical or virtual andcan be executed across one or more physical or virtual processors. Itshould also be noted that a given virtual device can be mapped to aportion of a physical one.

The disclosed read parameter prediction arrangements may be implementedusing one or more processing platforms. One or more of the processingmodules or other components may therefore each run on a computer,storage device or other processing platform element. A given suchelement may be viewed as an example of what is more generally referredto herein as a “processing device.”

Referring now to FIG. 24, one possible processing platform that may beused to implement at least a portion of one or more embodiments of thedisclosure is shown. The processing platform 2400 in this embodimentcomprises at least a portion of the given system and includes at leastone processing device(s), denoted 2402-1, 2402-2, 2402-3, . . . 2402-D,which communicate with one another over a network 2404. The network 2404may comprise any type of network, such as the Internet, a wireless areanetwork (WAN), a local area network (LAN), a satellite network, atelephone or cable network, a cellular network, a wireless network suchas WiFi or WiMAX, or various portions or combinations of these and othertypes of networks.

The processing device 2402-1 in the processing platform 2400 comprises aprocessor 2410 coupled to a memory 2412. The processor 2410 may comprisea microprocessor, a microcontroller, an application specific integratedcircuit (ASIC), a field programmable gate array (FPGA) or other type ofprocessing circuitry, as well as portions or combinations of suchcircuitry elements. The memory 2412 may comprise random access memory(RAM), read only memory (ROM) or other types of memory, in anycombination. The memory 2412 and other memories disclosed herein shouldbe viewed as illustrative examples of what are more generally referredto as “processor-readable storage media” storing executable program codeof one or more software programs.

Also included in the processing device 2402-1 is network interfacecircuitry 2414, which is used to interface the processing device withthe network 2404 and other system components, and may compriseconventional transceivers.

The other processing devices 2402, if any, of the processing platform2400 are assumed to be configured in a manner similar to that shown forprocessing device 2402-1 in the figure.

Again, the particular processing platform 2400 shown in the figure ispresented by way of example only, and the given system may includeadditional or alternative processing platforms, as well as numerousdistinct processing platforms in any combination, with each suchplatform comprising one or more computers, storage devices or otherprocessing devices.

Multiple elements of the system may be collectively implemented on acommon processing platform of the type shown in FIG. 24, or each suchelement may be implemented on a separate processing platform.

Articles of manufacture comprising such processor-readable storage mediaare considered illustrative embodiments. A given such article ofmanufacture may comprise, for example, a storage array, a storage diskor an integrated circuit containing RAM, ROM or other electronic memory,or any of a wide variety of other types of computer program products.The term “article of manufacture” as used herein should be understood toexclude transitory, propagating signals. Numerous other types ofcomputer program products comprising processor-readable storage mediacan be used.

Again, the particular processing platform 2400 shown in FIG. 24 ispresented by way of example only, and the read parameter predictionsystem may include additional or alternative processing platforms, aswell as numerous distinct processing platforms in any combination, witheach such platform comprising one or more computers, servers, storagedevices or other processing devices.

It should therefore be understood that in other embodiments differentarrangements of additional or alternative elements may be used. At leasta subset of these elements may be collectively implemented on a commonprocessing platform, or each such element may be implemented on aseparate processing platform.

Also, numerous other arrangements of computers, servers, storage devicesor other components are possible in the read parameter predictionsystem. Such components can communicate with other elements of the readparameter prediction system over any type of network or othercommunication media.

As indicated previously, components of an information processing systemas disclosed herein can be implemented at least in part in the form ofone or more software programs stored in memory and executed by aprocessor of a processing device. For example, at least portions of thefunctionality of the processes of FIGS. 9, 10, 17, 18A, 18B and/or 23are illustratively implemented in the form of software running on one ormore processing devices.

It should again be emphasized that the above-described embodiments arepresented for purposes of illustration only. Many variations and otheralternative embodiments may be used. For example, the disclosedtechniques are applicable to a wide variety of other types ofinformation processing systems and read parameter prediction systems.Also, the particular configurations of system and device elements andassociated processing operations illustratively shown in the drawingscan be varied in other embodiments. Moreover, the various assumptionsmade above in the course of describing the illustrative embodimentsshould also be viewed as exemplary rather than as requirements orlimitations of the disclosure. Numerous other alternative embodimentswithin the scope of the appended claims will be readily apparent tothose skilled in the art.

What is claimed is:
 1. A method, comprising: in response to a decodingfailure of one or more of a page of a memory and a codeword of thememory, performing the following steps; obtaining at least three readvalues of the one or more of the page and the codeword; and processingthe at least three read values to determine one or more read parameterscomprising one or more of: (i) at least one log likelihood ratio, and(ii) at least one center read reference voltage, wherein thedetermination is based on a signal count of a number of bits falling inparticular regions of a plurality of regions of the memory and whereinthe one or more determined read parameters are used for one more of adecoding of the page and the codeword following the decoding failure anda subsequent read operation following a successful decoding of the oneor more of the page and the codeword.
 2. The method of claim 1, whereinat least two of the at least three read values are obtained from thememory following the decoding failure.
 3. The method of claim 1, whereinthe signal counts are based on historical data.
 4. The method of claim1, wherein the signal counts indicate a location of a current centerreference voltage with respect to a substantially optimum centerreference voltage.
 5. The method of claim 1, wherein the signal countsindicate a reliability of the bits falling in the particular regions. 6.The method of claim 1, wherein the particular regions comprise at leasttwo regions adjacent to a read threshold voltage and wherein one or moreof the particular regions are differentiated using one or moreadditional read operations.
 7. The method of claim 1, wherein one ormore of the determined read parameters are characterized using a linearfunction of one or more of log likelihood ratios voltage offsets as afunction of the signal counts.
 8. The method of claim 7, wherein aplurality of parameters of the linear function are stored in a memoryfor each page type.
 9. The method of claim 1, wherein at least a portionof the step of processing the at least three read values is performedusing one or more of a hardware acceleration block, firmware, a statemachine and hardware.
 10. The method of claim 1, wherein the at leastthree read values of the one or more of the page and the codewordcomprises three read values of the one or more of the page and thecodeword.
 11. A tangible machine-readable recordable storage medium,wherein one or more software programs when executed by one or moreprocessing devices implement the steps of the method of claim
 1. 12. Anapparatus, comprising: a memory; and at least one processing device,coupled to the memory, operative to implement the following steps: inresponse to a decoding failure of one or more of a page of a memory anda codeword of the memory, performing the following steps; obtaining atleast three read values of the one or more of the page and the codeword;and processing the at least three read values to determine one or moreread parameters comprising one or more of: (i) at least one loglikelihood ratio, and (ii) at least one center read reference voltage,wherein the determination is based on a signal count of a number of bitsfalling in particular regions of a plurality of regions of the memoryand wherein the one or more determined read parameters are used for onemore of a decoding of the page and the codeword following the decodingfailure and a subsequent read operation following a successful decodingof the one or more of the page and the codeword.
 13. The apparatus ofclaim 12, wherein at least two of the at least three read values areobtained from the memory following the decoding failure.
 14. Theapparatus of claim 12, wherein the signal counts indicate a location ofa current center reference voltage with respect to a substantiallyoptimum center reference voltage.
 15. The apparatus of claim 12, whereinthe particular regions comprise at least two regions adjacent to a readthreshold voltage and wherein one or more of the particular regions aredifferentiated using one or more additional read operations.
 16. Theapparatus of claim 12, wherein one or more of the determined readparameters are characterized using a linear function of one or more oflog likelihood ratios voltage offsets as a function of the signalcounts.
 17. The apparatus of claim 16, wherein a plurality of parametersof the linear function are stored in a memory for each page type. 18.The apparatus of claim 12, wherein at least a portion of the step ofprocessing the at least three read values is performed using one or moreof a hardware acceleration block, firmware, a state machine andhardware.
 19. A storage controller comprising the apparatus of claim 12.20. A device comprising: a controller configured to perform thefollowing steps: in response to a decoding failure of one or more of apage of a memory and a codeword of the memory, performing the followingsteps; obtaining at least three read values of the one or more of thepage and the codeword; and processing the at least three read values todetermine one or more read parameters comprising one or more of: (i) atleast one log likelihood ratio, and (ii) at least one center readreference voltage, wherein the determination is based on a signal countof a number of bits falling in particular regions of a plurality ofregions of the memory and wherein the one or more determined readparameters are used for one more of a decoding of the page and thecodeword following the decoding failure and a subsequent read operationfollowing a successful decoding of the one or more of the page and thecodeword.